A METHOD FOR DETERMINING THE COEFFICIENT OF SPHERICAL ABERRATION FROM A SINGLE ELECTRON MICROGRAPH. = UNE METHODE POUR DETERMINER LE COEFFICIENT D'ABERRATION SPHERIQUE A PARTIR D'UNE SEULE MICROGRAPHIE ELECTRONIQUEKRIVANEK OL.1976; OPTIK; DTSCH.; DA. 1976; VOL. 45; NO 1; PP. 97-101; ABS. ALLEM.; BIBL. 10 REF.Article

THE INFLUENCE OF BEAM INTENSITY ON THE ELECTRON MICROSCOPE CONTRAST TRANSFER FUNCTION.KRIVANEK OL.1975; OPTIK; DTSCH.; DA. 1975; VOL. 43; NO 4; PP. 361-372; ABS. ALLEM.; BIBL. 20 REF.Article

SITE-SPECIFIC VALENCE DETERMINATION BY ELECTRON ENERGY-LOSS SPECTROSCOPYTAFTO J; KRIVANEK OL.1982; PHYS. REV. LETT.; ISSN 0031-9007; USA; DA. 1982; VOL. 48; NO 8; PP. 560-563; BIBL. 13 REF.Article

IMAGING AND MICROANALYSIS WITH HIGH SPATIAL RESOLUTION, CASTLE HOT SPRINGS, ARIZONA, USA, 5-9 JANUARY 1982 = IMAGES ET MICROANALYSE AVEC HAUTE RESOLUTION SPATIALE, CASTLE HOT SPRINGS, ARIZONA, ETATS-UNIS, 5-9 JANVIER 1982KRIVANEK OL ED.1982; ULTRAMICROSCOPY; ISSN 0304-3991; NLD; DA. 1982; VOL. 9; NO 3; PP. 175-323; BIBL. DISSEM.Conference Paper

THE STRUCTURE OF ULTRATHIN OXIDE ON SILICONKRIVANEK OL; MAZUR JH.1980; APPL. PHYS. LETTERS; ISSN 0003-6951; USA; DA. 1980; VOL. 37; NO 4; PP. 392-394; BIBL. 22 REF.Article

DIRECT OBSERVATION OF VOLTAGE BARRIERS IN ZNO VARISTORSKRIVANEK OL; WILLIAMS P; YI CHING LIN et al.1979; APPL. PHYS. LETTERS; USA; DA. 1979; VOL. 34; NO 11; PP. 805-806; BIBL. 13 REF.Article

GLASS-FREE GRAIN BOUNDARIES IN BESIN CERAMICSSHAW TM; KRIVANEK OL; THOMAS G et al.1979; J. AMER. CERAM. SOC.; USA; DA. 1979; VOL. 62; NO 5-6; PP. 305-306; BIBL. 12 REF.Article

A HIGH-RESOLUTION ELECTRON MICROSCOPY STUDY OF THE SI-SIO₂ INTERFACE.KRIVANEK OL; SHENG TT; TSUI DC et al.1978; APPL. PHYS. LETTERS; U.S.A.; DA. 1978; VOL. 32; NO 7; PP. 437-439; BIBL. 15 REF.Article

ACCURATE STIGMATING OF A HIGH VOLTAGE ELECTRON MICROSCOPE.KRIVANEK OL; ISODA S; KOBAYASHI K et al.1977; J. MICR.; G.B.; DA. 1977; VOL. 111; NO 3; PP. 279-282; BIBL. 5 REF.Article

ORIENTATION-DEPENDENT EXTENDED FINE STRUCTURE IN ELECTRON-ENERGY-LOSS SPECTRADISKO MM; KRIVANEK OL; REZ P et al.1982; PHYSICAL REVIEW. B: CONDENSED MATTER; ISSN 0163-1829; USA; DA. 1982; VOL. 25; NO 6; PP. 4252-4255; BIBL. 21 REF.Article

INTERPRETATION OF ELECTRON MICROGRAPHS AND DIFFRACTION PATTERNS OF AMORPHOUS MATERIALSHOWIE A; KRIVANEK OL; RUDEE ML et al.1973; PHILOS. MAG.; G.B.; DA. 1973; VOL. 27; NO 1; PP. 235-255; BIBL. 20 REF.Serial Issue

HIGH RESOLUTION IMAGING OF THE INTERFACIAL REGION IN METAL-INSULATOR SEMICONDUCTOR AND SCHOTTKY DIODESGREEN MA; BLAKERS AW; KRIVANEK OL et al.1983; JOURNAL OF APPLIED PHYSICS; ISSN 0021-8979; USA; DA. 1983; VOL. 54; NO 5; PP. 2885-2887; BIBL. 6 REF.Article

IMAGING OF THIN INTERGRANULAR PHASES BY HIGH-RESOLUTION ELECTRON MICROSCOPYKRIVANEK OL; SHAW TM; THOMAS G et al.1979; J. APPL. PHYS.; ISSN 0021-8979; USA; DA. 1979; VOL. 50; NO 6; PP. 4223-4227; BIBL. 21 REF.Article

LATTICE IMAGING OF A GRAIN BOUNDARY IN CRYSTALLINE GERMANIUM.KRIVANEK OL; ISODA S; KOBAYASHI K et al.1977; PHILOS. MAG.; G.B.; DA. 1977; VOL. 36; NO 4; PP. 931-940; BIBL. 21 REF.Article

THE MICROSTRUCTURE AND DISTRIBUTION OF IMPURITIES IN HOT-PRESSED AND SINTERED SILICON NITRIDES = MICROSTRUCTURE ET DISTRIBUTION D'IMPURETES DANS DES NITRURES DE SILICIUM-PRESSES A CHAUD ET FRITTESKRIVANEK OL; SHAW TM; THOMAS G et al.1979; J. AM. CERAM. SOC.; ISSN 0002-7820; USA; DA. 1979; VOL. 62; NO 11-12; PP. 585-590; BIBL. 24 REF.Article

INTERPRETATION OF ELECTRON MICROGRAPHS AND DIFFRACTION PATTERNS OF AMORPHOUS MATERIALSHOWIE A; KRIVANEK OL; RUDEE ML et al.1973; PHILOS. MAG.; G.B.; DA. 1973; VOL. 27; NO 1; PP. 235-255; BIBL. 20 REF.Serial Issue

AN APPLICATION OF EELS IN THE EXAMINATION OF INCLUSIONS AND GRAIN BOUNDARIES OF A SIC CERAMICBOURDILLON AJ; JEPPS NW; STOBBS WM et al.1981; J. MICROSC. (OXF.); ISSN 0022-2720; GBR; DA. 1981; VOL. 124; NO 1; PP. 49-56; BIBL. 2 P.Conference Paper

MICROSTRUCTURE-PROPERTY RELATIONSHIPS OF RARE-EARTH-ZINC-OXIDE VARISTORSWILLIAMS P; KRIVANEK OL; THOMAS G et al.1980; J. APPL. PHYS.; ISSN 0021-8979; USA; DA. 1980; VOL. 51; NO 7; PP. 3930-3934; BIBL. 20 REF.Article

PROCEEDINGS/IMAGING AND MICROANALYSIS WITH HIGH SPATIAL RESOLUTION, WINTER WORKSHOP, CASTLE HOT SPRINGS CONFERENCE CENTER AZ, JANUARY 5-9, 1982KRIVANEK OL ED.1982; IMAGING AND MICROANALYSIS WITH HIGH SPATIAL RESOLUTION. WINTER WORKSHOP/1982-01-05/CASTLE HOT SPRINGS AZ; USA; TEMPE: HREM FACILITY, CENTER FOR SOLID STATE SCIENCE, ARIZONA STATE UNIVERSITY; DA. 1982; 231 P.; 28 CMConference Proceedings